AR Optical Module Active Alignment System
主動式光學組裝 for AR Projector
透過Beam profile & 灰卡 確認照明模組、鏡片與 PBS間的相對位置，並透過精密的六軸系統調整；調整後亦可確認產品的虛擬距離(Virtual Image distance)
NST AI Knowledge Management System
Document Processing – Report Writing and Summarization: Automatically generate high-quality reports, presentations, and documents to significantly reduce writing time, enabling teams to focus on core business activities and greatly improve work efficiency. Data Analysis – Report Interpretation and Presentation: Transform complex data analysis results into clear and understandable natural language summaries, helping users quickly grasp
NST AI Vision Development System
This software is an AI vision project development system designed to help users quickly complete AI model training and deployment tasks. Users can efficiently develop high-quality AI models, significantly improving work efficiency The system’s main modules include the AI vision training software, AI vision inference system, and AI vision Runtime DLL. The AI vision inference
NST AI Re-inspection Software
NST AI Re-inspection System can be used to re-evaluate product images that have been marked as defective by AOI equipment, thereby reducing the false rejection rate of existing AOI systems. AI Re-inspection System uses artificial intelligence technology for re-evaluation, allowing continuous learning and optimization of the judgment model, which enhances the precision and accuracy of
NST AI Automatic Defect Classification System
NST AI ADC is a product developed using artificial intelligence technology that helps customers automatically classify product defects during the semiconductor manufacturing process, thereby enhancing production efficiency and product quality. The ADC system can automatically complete defect classification, significantly reducing the time and cost associated with manual inspection and judgment. Classification Reports: The system can
CIM System Architecture Integration
Turnkey CIM solutions (GEM upgrade, EAP System, RCM solution) for semiconductor industry old equipment or manual type equipment upgrade in order to achieve CIM system accessing and streaming function. Integrating customer MES, EAP and NST RCM system and generating automation scenario for remote control and data streaming functions. It can be implemented to not only
SECS/GEM
Connecting equipment for signal streaming to achieving SECS access function. Implementing RCM to capture image and data from equipment and following SECS/GEM certification for upper system handshaking. Using embedded OCR software for equipment image and data capturing and following SECS/GEM certification for upper system handshaking.
IDAS
LOT analysis: Inspection map date integration (Coordinates, overlays and detected photos). Process analysis: Machine difference comparison, defect quantity difference comparison, MAP defect distribution. Graphic function: output graphical analysis sheet. Tester data integration: tester result data and AOI inspection data mapping and analysis.