High-speed Wafer AOI Defect Inspection and AI defect classification system
✓ High-speed fly Trigger wafer inspection for top and back side in parallel
✓ Multiple light sources subject to different defect types
✓ Supporting 4"~12” wafer defect or CIS, glass substrate coating defect inspection
✓ Adaptable with AI defect classification system
✓ Optional IDAS(Inspection Data Analysis System) tool for porcedures optimization
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Camera module high-speed AA system
✓ Dual AA system, options for Lens or Sensor as datum
✓ Optional optical system either collimator or relay lens type
✓ High-speed precision 6-axis AA module
✓ Fully-auto load/unload system
✓ Plasma cleaning system
✓ Dark/White image testing system
✓ NST high-speed 6-axis image identification system
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Automotive camera module automation line solution
✓ Cleaning、AA、curing、image quality test、seal test、burning etc. fully-auto line
✓ Customize-able production line structure
✓ Applied for wide-angle camera module for automotive or IP camera applications
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OUR SOLUTION

Automotive

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AR/VR

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Semiconductor

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High End Optical/Vision/AI solution provider

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NST focuses on optics, imaging, and AI applications on automotive, metaverse and semiconductor market. Self-developed algorithms and testing software provide customers with flexible customization and real-time availability. Efficient testing tools and systems, welcome to chat with us about your needs.

02-7711-2766
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